DIN Standards Committee Materials Testing
Nanotechnologies - Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM
Abstract
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
Begin
2026-04-29
WI
00352079
Planned document number
DIN CEN ISO/TS 23879
Project number
06237105
Responsible national committee
NA 062-10-101 AA - Nanotechnologies
Responsible european committee
Responsible international committee
ISO/TC 229/JWG 2 - Joint ISO/TC 229 - IEC/TC 113 WG :Measurement and characterization
