NA 062

DIN Standards Committee Materials Testing

Project

Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

Contact

Batbayar Ganbaatar

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2038
Fax: +49 30 2601-42038

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