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NA 062

DIN Standards Committee Materials Testing

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Standards [Withdrawn]

DIN 50442-1
Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slices

Title (German)

Prüfung halbleitender anorganischer Stoffe; Bestimmung der Oberflächenstruktur kreisförmiger, einkristalliner Halbleiterscheiben; Gesägte und geläppte Scheiben

Document: references other documents

Document: referenced in other documents

Responsible national committee

NA 062 BR - Board of DIN Standards Committee for Materials Testing  

Edition 1981-02
Original language German
Price from 36.70 €
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Table of contents

Contact

Dipl.-Ing.

Michaela Treige

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2224
Fax: +49 30 2601-42224

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