NA 062

DIN Standards Committee Materials Testing

Standards [CURRENT]

ISO 17862
Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers

Title (German)

Chemische Oberflächenanalyse - Sekundärionen-Massenspektrometrie - Linearität der Intensitätsskale bei Einzelionen zählenden Flugzeit-Massenspektrometern

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6/WG 4 - Organic and Nano SIMS  

Edition 2022-09
Original language English
Price from 106.30 €
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Send message to contact