DIN Standards Committee Materials Testing
DIN 50449-2
Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung des Verunreinigungsgehaltes in III-V-Verbindungshalbleitern mittels Infrarotabsorption - Teil 2: Bor in Galliumarsenid
Document: references other documents
Responsible national committee
NA 062 BR - Board of DIN Standards Committee for Materials Testing