2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [Withdrawn]

DIN 50445
Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers

Title (German)

Prüfung von Materialien für die Halbleitertechnologie; Kontaktlose Messung des spezifischen elektrischen Widerstandes mit dem Wirbelstrom-Verfahren; Homogen dotierte Halbleiterscheiben

Document: references other documents

Document: referenced in other documents

Responsible national committee

NA 062 BR - Board of DIN Standards Committee for Materials Testing  

Edition 1992-04
Original language German
Price from 36.70 €
Order from DIN Media
Table of contents

Contact

Dipl.-Ing.

Jan Henrik Krafft

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2937
Fax: +49 30 2601-42937

Send message to contact