NA 062

DIN Standards Committee Materials Testing

Pre-standard

ISO/TS 24597
Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Title (German)

Mikrobereichsanalyse - Rasterelektronenmikroskopie - Verfahren zur Ermittlung der Bildschärfe

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 4 - Scanning electron microscopy  

Edition 2011-06
Original language English
Price from 239.00 €
Table of contents

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

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