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NA 062

DIN Standards Committee Materials Testing

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Standards [Withdrawn]

DIN 50431
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array

Title (German)

Prüfung von Materialien für die Halbleitertechnologie; Messung des spezifischen elektrischen Widerstandes von Einkristallen aus Silicium oder Germanium mit dem Vier-Sonden-Gleichstrom-Verfahren bei linearer Anordnung der Sonden

Document: references other documents

Document: referenced in other documents

Responsible national committee

NA 062 BR - Board of DIN Standards Committee for Materials Testing  

Edition 1988-05
Original language German
Price from 43.40 €
Order from DIN Media
Table of contents

Contact

Dipl.-Ing.

Jan Henrik Krafft

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2937
Fax: +49 30 2601-42937

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