2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Project

Microbeam analysis - Scanning electron microscopy - Tagged image file format for scanning electronmicroscopy (TIFF/SEM)

Begin

2026-01-05

Planned document number

ISO/AWI 20171

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 4 - Scanning electron microscopy  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2058

Send message to contact