2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

About NMP Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Project

Microbeam analysis - Analytical electron microscopy - Method for data acquisition and processing of three-dimensional electron diffraction

Begin

2026-08-21

Planned document number

ISO/AWI 25835

Responsible national committee

NA 062-09-104 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

Contact

Batbayar Ganbaatar

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2038
Fax: +49 30 2601-42038

Send message to contact