DIN Standards Committee Materials Testing
Microbeam analysis - Analytical electron microscopy - Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
Begin
2024-03-27
Planned document number
ISO/DIS 16887
Responsible national committee
NA 062-08-18 AA - Electron microscopy and microbeam analysis
Responsible international committee
ISO/TC 202/SC 3 - Analytical electron microscopy
draft standard
Microbeam analysis - Analytical electron microscopy - Guidelines for transmission electron microscopy specimen preparation by lift-out method using focused ion beam system
2026-03
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