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NA 062

DIN Standards Committee Materials Testing

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Draft standard [New]

ISO/DIS 13084
Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Title (German)

Chemische Oberflächenanalyse - Sekundärionen-Massenspektrometrie - Kalibrierung der Massenskale für einen Flugzeit-Sekundärionen-Massenspektrometer

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6/WG 4 - Organic and Nano SIMS  

Edition 2025-03
Public enquiry period until 2025-06-09
Original language English
Price from 74.40 €
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Steffen Jenkel

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