Abstract

This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.

Begin

2026-04-29

WI

00352079

Planned document number

DIN CEN ISO/TS 23879

Project number

06237105

Responsible national committee

NA 062-10-101 AA - Nanotechnologies  

Responsible european committee

CEN/TC 352 - Nanotechnologies  

Responsible international committee

ISO/TC 229/JWG 2 - Joint ISO/TC 229 - IEC/TC 113 WG :Measurement and characterization