Publications of DKE/K 631

DIN EN IEC 60749-28 ; VDE 0884-749-28:2024-12 2024-12 Standards Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022 More  Order from DIN Media
DIN EN IEC 60749-30 2023-02 Standards Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020 More  Order from DIN Media
DIN EN IEC 60749-34-1 2026-07 Standards Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (IEC 60749-34-1:2025); German version EN IEC 60749-34-1:2025 More  Order from DIN Media
DIN EN IEC 60749-37 2023-12 Standards Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2022); German version EN IEC 60749-37:2022 More  Order from DIN Media
DIN EN IEC 60749-39 2023-10 Standards Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (IEC 60749-39:2021); German version EN IEC 60749-39:2022 More  Order from DIN Media
DIN EN IEC 60749-41 2023-03 Standards Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020 More  Order from DIN Media
DIN EN IEC 61967-1 ; VDE 0847-21-1:2019-09 2019-09 Standards Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 61967-1:2018); German version EN IEC 61967-1:2019 More  Order from DIN Media
DIN EN IEC 61967-4 ; VDE 0847-21-4:2023-08 2023-08 Standards Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method (IEC 61967-4:2021); German version EN IEC 61967-4:2021 More  Order from DIN Media
DIN EN IEC 61967-8 ; VDE 0847-21-8:2024-10 2024-10 Standards Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2023); German version EN IEC 61967-8:2023 More  Order from DIN Media
DIN EN IEC 62132-8 ; VDE 0847-22-8:2026-07 2026-07 Draft standard Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 47A/1182/CDV:2025); German and English version prEN IEC 62132-8:2025 More  Order from DIN Media

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