Publications of NA 062

DIN 50162 1978-09 Standards Testing of clad steels; determination of shear strength between cladding metal and parent metal in shear test More  Order from DIN Media
DIN 50450-2 2026-03 Standards Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell More  Order from DIN Media
DIN 50450-9 2021-07 Standards Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography More  Order from DIN Media
DIN 50451-3 2014-11 Standards Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS More  Order from DIN Media
DIN 50451-4 2024-09 Standards Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS) More  Order from DIN Media
DIN 50451-5 2022-08 Standards Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram More  Order from DIN Media
DIN 50451-6 2014-11 Standards Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH₄F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid More  Order from DIN Media
DIN 50451-7 2018-04 Standards Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS More  Order from DIN Media
DIN 50451-8 2022-08 Standards Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS More  Order from DIN Media
DIN 50452-1 1995-11 Standards Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles More  Order from DIN Media

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