Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
Edition 1995-06

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011) (german version)
Edition 2012-03-01

Generic specification: Monolithic integrated circuits; German version EN 190000:1995
Edition 1996-05

Space product assurance - Availability analysis; English version EN 16602-30-09:2014
Edition 2014-12

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04

Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology (IEC 61676:2002+A1:2008); German version EN 61676:2002+A1:2009
Edition 2010-05

Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology (IEC/CDV 61676:2021); German and English version prEN IEC 61676:2022
Edition 2022-05

Integrated circuits - Manufacturing line approval application guideline (IEC 61943:1999); German version EN 61943:1999
Edition 2001-10

Space product assurance - Electrical, electronic and electromechanical (EEE) components; English version EN 16602-60:2023
Edition 2023-10