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DIN EN 190116
Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
Edition 1995-06
OEVE/OENORM EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011) (german version)
Edition 2012-03-01
DIN EN 190000
Generic specification: Monolithic integrated circuits; German version EN 190000:1995
Edition 1996-05
DIN EN 16602-30-09
Space product assurance - Availability analysis; English version EN 16602-30-09:2014
Edition 2014-12
DIN EN 60749-38
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
Edition 2008-10
DIN EN 60749-44
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
Edition 2017-04
DIN EN 16602-60
Space product assurance - Electrical, electronic and electromechanical (EEE) components; English version EN 16602-60:2015
Edition 2015-11
DIN EN 16602-60
Space product assurance - Electrical, electronic and electromechanical (EEE) components; English version prEN 16602-60:2021
Edition 2021-10
DIN EN IEC 61676
Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology (IEC/CDV 61676:2021); German and English version prEN IEC 61676:2022
Edition 2022-05
DIN EN 61676
Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology (IEC 61676:2002+A1:2008); German version EN 61676:2002+A1:2009
Edition 2010-05
