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ABNT NBR IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Edition
2011-03-02
EIA JESD 78F.02
IC Latch-Up Test
Edition
2023-11
UNE-EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Edition
2011-11-01
EIA JEP 193
Survey On Latch-Up Testing Practices and Recommendations for Improvements
Edition
2022-12
DIN EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition
2012-01
SN EN 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Edition
2011-08
BS EN 60749-29
Semiconductor devices. Mechanical and climatic test methods. Latch-up test
Edition
2011-08-31
DIN EN 16602-20-10
Space product assurance - Off-the-shelf items utilization in space systems; English version EN 16602-20-10:2014
Edition
2014-12
DIN IEC 60319
Presentation and specification of reliability data for electronic components (IEC 60319:1999)
Edition
2003-02
DIN EN 190109
Family specification - Digital integrated HC MOS circuits - Series HC/HCT/HCU; German version EN 190109:1994
Edition
1996-11
