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Standards [CURRENT]

ABNT NBR IEC 60749-29

Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Edition 2011-03-02

Standards [CURRENT]

EIA JESD 78F.02

IC Latch-Up Test
Edition 2023-11

Standards [CURRENT]

UNE-EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Edition 2011-11-01

Technical rule [CURRENT]

EIA JEP 193

Survey On Latch-Up Testing Practices and Recommendations for Improvements
Edition 2022-12

Standards [CURRENT]

DIN EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011
Edition 2012-01

Standards [CURRENT]

SN EN 60749-29

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Edition 2011-08

Standards [CURRENT]

BS EN 60749-29

Semiconductor devices. Mechanical and climatic test methods. Latch-up test
Edition 2011-08-31

Standards [CURRENT]

DIN EN 16602-20-10

Space product assurance - Off-the-shelf items utilization in space systems; English version EN 16602-20-10:2014
Edition 2014-12

Standards [CURRENT]

DIN IEC 60319

Presentation and specification of reliability data for electronic components (IEC 60319:1999)
Edition 2003-02

Standards [CURRENT]

DIN EN 190116

Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
Edition 1995-06

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