NA 062

DIN Standards Committee Materials Testing

Standards [Withdrawn]

DIN 50431
Testing of semi-conducting inorganic materials; measurement of the electrical resistivity of silicon or germanium single crystals by means of the four-point-probe direct current method with collinear four probe array

Title (German)

Prüfung halbleitender anorganischer Stoffe; Messung des spezifischen elektrischen Widerstandes von Einkristallen aus Silicium oder Germanium mit dem Vier-Sonden-Gleichstrom-Verfahren bei linearer Anordnung der Sonden

Document: references other documents

Document: referenced in other documents

Responsible national committee

NA 062 - DIN Standards Committee Materials Testing  

Edition 1980-09
Original language German
Price from 35.60 €
Table of contents

Contact

Dipl.-Ing.

Michaela Treige

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2224
Fax: +49 30 2601-42224

Send message to contact