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NA 062

DIN Standards Committee Materials Testing

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Standards [Withdrawn]

DIN 50435
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method

Title (German)

Prüfung von Materialien für die Halbleitertechnologie; Bestimmung der radialen Variation des spezifischen elektrischen Widerstandes an Silicium- oder Germanium-Scheiben mit dem Vier-Sonden-Gleichstromverfahren

Document: references other documents

Responsible national committee

NA 062 BR - Board of DIN Standards Committee for Materials Testing  

Edition 1988-05
Original language German
Price from 36.70 €
Order from DIN Media
Table of contents

Contact

Dipl.-Ing.

Michaela Treige

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2224
Fax: +49 30 2601-42224

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