NA 062
DIN Standards Committee Materials Testing
Standards
[Withdrawn]
DIN 50435
DIN 50435
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method
Title (German)
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung der radialen Variation des spezifischen elektrischen Widerstandes an Silicium- oder Germanium-Scheiben mit dem Vier-Sonden-Gleichstromverfahren
Document: references other documents
Responsible national committee
NA 062 BR - Board of DIN Standards Committee for Materials Testing
