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NA 062

DIN Standards Committee Materials Testing

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Project

Surface chemical analysis - Atomic force microscopy - Guideline for quantitative nanoscale potential measurement by Kelvin probe force microscopy

Begin

2026-03-02

Planned document number

ISO/AWI 26210

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 9/WG 6 - Use of ESPM  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2058

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