2. Getting involved
  3. Standards Committees
  4. NMP
NA 062

DIN Standards Committee Materials Testing

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Project

Microbeam analysis --Analytical electron microscopy - Method of thickness measurement for thin crystals by convergent beam electron diffraction

Begin

2025-07-28

Planned document number

ISO/AWI 25871

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 3 - Analytical electron microscopy  

Contact

Steffen Jenkel

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2058

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