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NA 062

DIN Standards Committee Materials Testing

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ISO/TC 201/SC 6
Secondary ion mass spectrometry

Publications Projects

Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, qualitative analysis, and quantitative analysis in the use of secondary ion mass spectrometry, sputtered neutral mass spectrometry, and fast atom bombardment mass spectrometry for surface chemical analysis.

National mirror committee of ISO/TC 201/SC 6

Committee ID Name
NA 062-08-16 AA Surface chemical analysis and scanning probe microscopy