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NA 062

DIN Standards Committee Materials Testing

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Draft standard [Withdrawn]

DIN 50445
Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method

Title (German)

Prüfung von Materialien für die Halbleitertechnologie; Kontaktlose Messung des spezifischen elektrischen Widerstandes von Halbleiterscheiben nach dem Wirbelstrom-Verfahren

Document: references other documents

Document: referenced in other documents

Responsible national committee

NA 062 BR - Board of DIN Standards Committee for Materials Testing  

Edition 1989-07
Original language German
Price from 47.20 €
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Table of contents

Contact

Dipl.-Ing.

Jan Henrik Krafft

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2937
Fax: +49 30 2601-42937

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