Projects of DKE/K 631

DIN EN IEC 62433-4 2026-01-28 EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI) More  Comment 
DIN EN IEC 60749-29 2025-11-13 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test More  Comment 
DIN EN IEC 63567-3 2025-10-16 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light More  Comment 
DIN IEC/TR 62433-4-1 2025-08-20 EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB More  Comment 
DIN EN IEC 63567-4 2025-08-20 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process More  Comment 
DIN EN IEC 63550-4 2025-07-23 Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025 More  Comment 
DIN EN IEC 63550-3 2025-07-23 Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025 More  Comment 
DIN EN IEC 63550-2 2025-07-23 Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025 More  Comment 
DIN EN IEC 63550-1 2025-06-27 Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025 More  Comment 
DIN EN IEC 63664 2025-06-25 Integrated Circuits - Electronic fuses for low voltage automotive power distribution networks More  Comment 

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