Publications of DKE/K 631

DIN EN IEC 60749-18 2020-02 Standards Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019 More  Order from DIN Media
DIN EN IEC 60749-20 2023-07 Standards Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020 More  Order from DIN Media
DIN EN IEC 60749-20-1 2018-11 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018 More  Order from DIN Media
DIN EN IEC 60749-21 ; VDE 0884-749-21:2025-04 2025-04 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/2862/CDV:2024); German and English version prEN IEC 60749-21:2024 More  Order from DIN Media
DIN EN IEC 60749-22-1 2026-11 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods (IEC 60749-22-1:2025); German version EN IEC 60749-22-1:2026 More  Read draft and comment
DIN EN IEC 60749-22-2 2026-11 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods (IEC 60749-22-2:2025); German version EN IEC 60749-22-2:2026 More  Read draft and comment
DIN EN IEC 60749-23 2025-10 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024 More  Order from DIN Media
DIN EN IEC 60749-24 ; VDE 0884-749-24:2025-04 2025-04 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024 More  Order from DIN Media
DIN EN IEC 60749-26 ; VDE 0884-749-26:2025-10 2025-10 Draft standard Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/2882/CDV:2024); German and English version prEN IEC 60749-26:2024 More  Order from DIN Media
DIN EN IEC 60749-26 ; VDE 0884-749-26 2018-10 Standards Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018 More  Order from DIN Media

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