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Hydrogen Technologies Standards form the basic framework for market ramp-up
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Publications of DKE/K 631

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DIN EN IEC 60749-18	2020-02	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019 More	Order from DIN Media
DIN EN IEC 60749-20	2023-07	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020); German version EN IEC 60749-20:2020 More	Order from DIN Media
DIN EN IEC 60749-20-1	2018-11	Draft standard	Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat (IEC 47/2488/CDV:2018); German and English version prEN IEC 60749-20-1:2018 More	Order from DIN Media
DIN EN IEC 60749-21 ; VDE 0884-749-21:2025-04	2025-04	Draft standard	Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/2862/CDV:2024); German and English version prEN IEC 60749-21:2024 More	Order from DIN Media
DIN EN IEC 60749-23	2025-10	Draft standard	Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024 More	Order from DIN Media
DIN EN IEC 60749-24 ; VDE 0884-749-24:2025-04	2025-04	Draft standard	Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST (IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024 More	Order from DIN Media
DIN EN IEC 60749-26 ; VDE 0884-749-26	2018-10	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018 More	Order from DIN Media
DIN EN IEC 60749-26 ; VDE 0884-749-26:2025-10	2025-10	Draft standard	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 47/2882/CDV:2024); German and English version prEN IEC 60749-26:2024 More	Order from DIN Media
DIN EN IEC 60749-28 ; VDE 0884-749-28:2024-12	2024-12	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022 More	Order from DIN Media
DIN EN IEC 60749-30	2023-02	Standards	Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020 More	Order from DIN Media

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