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Draft standard [New]

DIN EN IEC 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2881/CDV:2024); German and English version prEN IEC 60749-23:2024

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur (IEC 47/2881/CDV:2024); Deutsche und Englische Fassung prEN IEC 60749-23:2024

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2025-10
Original language German , English
Price from 72.60 €
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Table of contents

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