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DIN EN IEC 63550-2
Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025
DIN EN IEC 63550-3
Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025
DIN EN IEC 63550-4
Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025
DIN EN IEC 63550-5
Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices
DIN EN IEC 63550-6
Semiconductor devices-Neuromorphic devices - Part 6:Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays
DIN EN IEC 63551-1
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR
DIN EN IEC 63551-2
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR
DIN EN IEC 63551-3
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 3: Thermal imagers
DIN EN IEC 63551-5
Semiconductor devices - Detection modules of autonomous land vehicle - Part 5: Testing methods of performance for ultrasonic modules
DIN EN IEC 63551-6
Semiconductor devices - Detection modules of autonomous land vehicle - Part 6: Testing methods of performance for visual imaging modules
