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Draft standard [Pre-order]

DIN EN IEC 63550-4 ; VDE 0884-3550-4:2026-05
Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025

Title (German)

Halbleiterbauelemente - Neuromorphe Bauelemente - Teil 4: Bewertungsmethode für Asymmetrien in Memristor-Bauelementen (IEC 47/2940/CDV:2025); Deutsche und Englische Fassung prEN IEC 63550-4:2025

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2026-05
Publication 2026-04-03
Public enquiry period 2026-04-03
until
2026-06-03
Original language German , English
Price from 20.08 €
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