Norm-Entwurf
[ZURÜCKGEZOGEN]
PR NF C96-287-2
; PR NF EN IEC 63287-2
PR NF C96-287-2
; PR NF EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Titel (englisch)
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
