Norm [AKTUELL]

UNE-EN 62047-26
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)

Titel (englisch)

Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)

Ausgabe 2016-06-01
Originalsprache Englisch
Preis ab 76,00 €
Inhaltsverzeichnis