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NA 022

DKE Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE

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IEC 47E/425/NP 2011-09-30 Future IEC 60747-14-7: Semiconductor devices - Part 14-7: Semiconductor sensors - Flow meter Mehr  Kontakt zu DIN 
IEC 47E/426/NP 2011-09-30 Future IEC 60747-14-8: Semiconductor devices - Part 14-8: Semiconductor sensors - Capacitive degradation sensor of liquid Mehr  Kontakt zu DIN 
IEC 47F/106/NP 2011-09-30 Future IEC 62047-15: Semiconductor devices Micro-electromechanical devices - Part 15: Test method of bonding strength between PDMS and glass Mehr  Kontakt zu DIN 
IEC 47F/107/NP 2011-09-30 Future IEC 62047-16: Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films; wafer curvature and cantilever beam deflection methods Mehr  Kontakt zu DIN 
IEC 47F/105/NP 2011-09-30 Future IEC 62047-23: Semiconductor devices - Micro-electromechanical devices - Part 23: Test methods for determining residual stresses of MEMS films; wafer curvature and cantilever beam deflection methods Mehr  Kontakt zu DIN 
IEC 17C/533/CD 2011-09-30 IEC 62271-201 Ed. 2.0: High-voltage switchgear and controlgear - Part 201: AC solid-insulation enclosed switchgear and controlgear for rated voltages above 1 kV and up to and including 52 kV Mehr  Kontakt zu DIN 
IEC 23A/640/CD 2011-09-30 IEC 62275 Ed.2: Cable management systems - Cable ties for electrical installations Mehr  Kontakt zu DIN 
IEC 93/316/CD 2011-09-30 IEC 62699 Ed 1.0: Mapping rules and exchanges methods for hetrogeneous parts libraries Mehr  Kontakt zu DIN 
IEC 46A/1049A/NP 2011-09-30 Revised text numbering for document: Coaxial Communication Cables - Part 9: Sectional specification for flexible RF Coaxial Cables Mehr  Kontakt zu DIN 
IEC 45B/742/CDV 2011-09-23 IEC 61577-2 Ed.2: Radiation Protection Instrumentation - Radon and radon decay product measuring instruments - Part 2: Specific requirements for 222Rn and 220Rn measuring instruments Mehr  Kontakt zu DIN 

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