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Projekte von NA 022

IEC 87/532/CD 2013-04-05 IEC 62736: Ultrasonics - Pulse-Echo Scanners - Quality Control of Diagnostic Medical Ultrasound Systems - Simple Methods for Periodic Testing to Verify Stability of an Imaging System's Elementary Performance Mehr  Kontakt zu DIN 
IEC 62D/1070/CDV 2013-04-05 ISO 80601-2-70: Medical electrical equipment - Part 2-70: Particular requirements for basic safety and essential performance of sleep apnoea breathing therapy equipment Mehr  Kontakt zu DIN 
IEC 49/1051/CD 2013-03-29 IEC 60679-1 Ed.4 : Piezoelectric and associated material oscillators of assessed quality - Part 1 : Generic specification Mehr  Kontakt zu DIN 
IEC 57/1320/CDV 2013-03-29 IEC 60870-6-503 Ed.3: Telecontrol equipment and systems - Part 6-503: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - TASE.2 Services and protocol Mehr  Kontakt zu DIN 
IEC 57/1321/CDV 2013-03-29 IEC 60870-6-702 Ed.2: Telecontrol equipment and systems - Part 6-702: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - Functional profile for providing the TASE.2 application service in end systems Mehr  Kontakt zu DIN 
IEC 57/1322/CDV 2013-03-29 IEC 60870-6-802 Ed.3: Telecontrol equipment and systems - Part 6-802: Telecontrol protocols compatible with ISO standards and ITU-T recommendations - TASE.2 Object models Mehr  Kontakt zu DIN 
IEC 57/1323/CDV 2013-03-29 IEC 61968-8 Ed.1: Application integration at electric utilities - System interfaces for distribution management - Part 8: Interface standard for customer support Mehr  Kontakt zu DIN 
IEC 47F/148/CDV 2013-03-29 IEC 62047-22 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates Mehr  Kontakt zu DIN 
IEC 22/211A/DTS 2013-03-29 IEC/TS 62578 Ed. 2: Power electronics systems and equipment - Operation conditions and characteristics of active infeed converter (AIC) applications including design recommendations for their emission values below 150 kHz Mehr  Kontakt zu DIN 
IEC 47F/151/CD 2013-03-22 IEC 62047-16 Ed. 1: Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films?wafer curvature and cantilever beam deflection methods Mehr  Kontakt zu DIN 

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