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Project

Microbeam analysis--Preparation of sectional specimens for metallic materials using focused ion beam

Begin

2026-06-12

Planned document number

ISO/AWI 26665

Responsible national committee

NA 062-09-104 AA - Electron microscopy and microbeam analysis

Responsible international committee

ISO/TC 202/WG 11 - Preparation of sectional specimens for metallic materials using focused ion beam

Contact

Batbayar Ganbaatar

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2038
Fax: +49 30 2601-42038

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