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Standards [CURRENT]

ISO 23830
Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Title (German)

Chemische Analytik an Oberflächen - Sekundärionenmassenspektromtrie - Wiederholpräzision und Konstanz der relativen Intensitätsskala bei der statischen Sekundärionenmassenspektromtrie

Responsible national committee

NA 062-08-16 AA - Surface chemical analysis and scanning probe microscopy  

Responsible international committee

ISO/TC 201/SC 6 - Secondary ion mass spectrometry  

Edition 2008-11
Original language English
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Table of contents

Contact

Steffen Jenkel

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