Technical services
NA 062-08-18 AA
Electron microscopy and microbeam analysis
NA 062-09-104 AA “Microbereichsanalyse und Elektronenmikroskopie” is the national mirror committee for ISO/TC 202 “Microbeam Analysis” and develops standards in the field of microbeam analysis, which uses electrons as the incident beam and electrons and photons as the detection signal. The objective is to analyze the composition and structural properties of solids. The scope of the standardization activity includes measurements, parameters, methods, and reference materials.
