• Hydrogen Technologies Standards form the basic framework for market ramp-up

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  • Climate change Standards and specifications support climate targets

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  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

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Projects of DKE/K 631

Document number Begin Title Comment
IEC 47/1987/DC 2008-08-22 Maintenance of IEC 60747-1 Ed. 2.0: Semiconductor devices - Part 1: General More  Comment 
IEC 47A/797/DC 2008-08-15 Proposed a new convenor of WG 9 (Test procedures and measurement methods for EMC in integrated circuits) of IEC SC 47A More  Comment 
IEC 47A/835/CDV 2008-06-13 IEC 61967-8 Ed.1: Integrated Circuits Measurement of Electromagnetic Emissions Part 8: Measurement of radiated emissions - IC stripline method More  Comment 
IEC 47A/863/CDV 2008-06-13 IEC 62132-8 Ed.1: Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method More  Comment 
IEC 47/1973/NP 2008-05-09 PNW 47-1973: Transmission line pulse measurement of human body model parameters for electrostatic discharge protection design of semiconductor devices More  Comment 
IEC 47/2052/CDV 2008-05-09 IEC 60749-40 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge More  Comment 
IEC 47/1967/DC 2008-04-04 Proposed transfer of Technical Report, IEC/TR 62380 Ed. 1, to IEC/TC 56 (Dependability) More  Comment 
IEC 110/134/NP 2008-02-15 Proposal of Korean NC: Measurement methods of LED backlight unit for liquid crystal displays More  Comment 
IEC 47/2085/FDIS 2008-01-25 IEC 62258-2 Ed.2: SEMICONDUCTOR DIE PRODUCTS - Part 2: Exchange data formats More  Comment 
IEC 47/1911A/DC 2007-06-15 Proposal of the French NC: Reliability engineering in electronics(Numbering of clauses/paragraphs) More  Comment 

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