Publications of DKE/K 631

DIN EN IEC 63287-1 2023-09 Standards Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021); German version EN IEC 63287-1:2021 More  Order from DIN Media
DIN EN IEC 63287-2 2024-10 Standards Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 63287-2:2023); German version EN IEC 63287-2:2023 More  Order from DIN Media
DIN EN IEC 63287-3 2025-04 Draft standard Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module (IEC 47/2873/CDV:2024); German and English version prEN IEC 63287-3:2024 More  Order from DIN Media
DIN EN IEC 63364-1 2025-01 Standards Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023 More  Order from DIN Media
DIN EN IEC 63373 2023-08 Standards Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (IEC 63373:2022); German version EN IEC 63373:2022 More  Order from DIN Media
DIN EN IEC 63550-1 ; VDE 0884-3550-1:2026-05 2026-05 Draft standard Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices (IEC 47/2943/CDV:2025); German and English version prEN IEC 63550-1:2025 More  Order from DIN Media
DIN EN IEC 63550-2 ; VDE 0884-3550-2:2026-05 2026-05 Draft standard Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices (IEC 47/2942/CDV:2025); German and English version prEN IEC 63550-2:2025 More  Order from DIN Media
DIN EN IEC 63550-3 ; VDE 0884-3550-3:2026-05 2026-05 Draft standard Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices (IEC 47/2941/CDV:2025); German and English version prEN IEC 63550-3:2025 More  Order from DIN Media
DIN EN IEC 63550-4 ; VDE 0884-3550-4:2026-05 2026-05 Draft standard Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices (IEC 47/2940/CDV:2025); German and English version prEN IEC 63550-4:2025 More  Order from DIN Media
DIN IEC 60559 1992-01 Standards Binary floating-point arithmetic for microprocessor systems (IEC 60559:1989); german version HD 592 S1:1991 More  Order from DIN Media

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