• Hydrogen Technologies Standards form the basic framework for market ramp-up

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  • Climate change Standards and specifications support climate targets

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  • Smart Farming Standards and specifications are drivers for the digitalization of agriculture

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Publications of NA 062-08-16 AA

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ISO 17560 2014-09 Standards Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon More  Order from DIN Media
ISO 17862 2022-09 Standards Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers More  Order from DIN Media
ISO 17973 2024-07 Standards Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis More  Order from DIN Media
ISO 17974 2002-10 Standards Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis More  Order from DIN Media
ISO 18114 2021-05 Standards Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials More  Order from DIN Media
ISO 18115-1 2023-06 Standards Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy More  Order from DIN Media
ISO 18115-2 2021-12 Standards Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning-probe microscopy More  Order from DIN Media
ISO 18115-3 2022-06 Standards Surface chemical analysis - Vocabulary - Part 3: Terms used in optical interface analysis More  Order from DIN Media
ISO 18118 2024-02 Standards Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials More  Order from DIN Media
ISO 18337 2015-06 Standards Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope More  Order from DIN Media

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