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DIN EN IEC 63581-1
The recognition criteria of defects in polished indium phosphide wafers - Part 1: Classification of defects
prEN 12272-2 rev
Surface dressing - Test methods - Part 2: Visual assessment of defects
DIN EN IEC 63567-3
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
prEN 12274-8 rev
Slurry surfacing - Test methods - Part 8: Visual assessment of defects
ISO/DIS 23974-1
Leather - Red hair sheep skin - Part 1: Description of defects
CEN/CLC/WS ZDMTerm
Zero Defects in Digital Manufacturing Terminology
prEN ISO 21227-1 rev
Paints and varnishes - Evaluation of defects on coated surfaces using optical imaging - Part 1: General guidance
DIN EN ISO 21227-1 rev
Paints and varnishes - Evaluation of defects on coated surfaces using optical imaging - Part 1: General guidance
ISO/DIS 23974-2
Leather - Red hair sheep skins - Part 2: Guidelines for grading on the basis of defects
ISO/DIS 21227-1
Paints and varnishes - Evaluation of defects on coated surfaces using digital image processing - Part 1: General guidance
