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Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Digital addressable lighting interface - Part 225: Particular requirements for control gear - Adaptive escape lighting (device type 24)(IEC 34/1199/NP:2024)

Digital addressable lighting interface - Part 351: Particular requirements - Control devices - Luminaire-mounted control devices (IEC 62386-351:2025); German version EN IEC 62386-351:2025

Radiation protection instrumentation - Dosimetry systems with integrating passive detectors for individual, workplace and environmental monitoring of photon and beta radiation; German and English version EN IEC 62387:2022/prAB:2025

Nuclear power plants - Instrumentation and control important to safety - Resistance temperature detectors (IEC 62397:2022); German version EN IEC 62397:2026

Obsolescence management - Part 1: Policy, plan and process (IEC 56/2122/CD:2025)

Obsolescence Management - Part 2: Forecasting obsolescence cost (56/2056/CD:2024)

Obsolescence Management - Part 3: Exchange of information regarding change and discontinuance of products (56/2047/CD:2024)

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

Industrial communication networks - High availability automation networks - Part 3: Parallel Redundancy Protocol (PRP) and High-availability Seamless Redundancy (HSR)

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