DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Abstract
This part of IEC 62433 specifies a procedure for deriving a macro model that can be used to simulate the immunity to conducted disturbances of an integrated circuit (IC). This model is commonly referred to as the Integrated Circuit Immunity Model – Conducted Immunity (ICIM-CI). It is used to predict the immunity levels to conducted RF disturbances at IC connection pins. To evaluate the immunity threshold of an electronic component, this macro model is entered into a simulation tool for electrical circuits. This macro model can be used to model both analog and digital ICs (input/output, digital core, and power supply). The nonlinearity effects of the IC are not taken into account by this macro model. The additional benefit of ICIM-CI is that simulations can also be used to predict immunity at the PCB and system levels. This part of IEC 62433 consists of two main parts: – the electrical description of the elements of the ICIM-CI macro model; – a universal data exchange format, known as CIML, which is based on XML. This format enables a usable and general form of ICIM-CI coding for the simulation of immunity.
Begin
2026-01-28
Planned document number
DIN EN IEC 62433-4
Project number
02233612
