2. Getting involved
  3. Standards Committees
  4. NIA
NA 043

DIN Standards Committee Information Technology and IT Applications

About NIA Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Project

Information technology - Biometric deepfake attack detection - Testing and reporting

Begin

2026-05-11

Planned document number

ISO/IEC AWI 26655

Responsible national committee

NA 043-04-37 AA - Biometrics  

Responsible international committee

ISO/IEC JTC 1/SC 37/WG 5 - Biometric testing and reporting  

Contact

Ulrike De Grande

Am DIN-Platz, Burggrafenstr. 6
10787 Berlin

Tel.: +49 30 2601-2320
Fax: +49 30 2601-42320

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