NA 043
DIN Standards Committee Information Technology and IT Applications
Project
Single-electron sources - Terminology, metrics, and characterization methods
Abstract
This document defines a set of metrics and a common terminology for single-electron sources taking into account different realization schemes. Based on this foundation, the main parameters of interest are specified and experimental procedures for measuring these parameters are identified. Characterization methods, including the minimal requirements for the reporting of the experimental setup, the operation conditions, and the data analysis are given.
Begin
2025-12-01
WI
JT022020
Planned document number
JT022020
Responsible national committee
NA 043-02-05 AA - Quantum Technologies
