2. Getting involved
  3. Standards Committees
  4. NAOrg
NA 175

DIN Standards Committee for Organizational Processes

About NAOrg Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees
Standards [CURRENT]

DIN EN IEC 60749-41
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020); German version EN IEC 60749-41:2020

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen (IEC 60749-41:2020); Deutsche Fassung EN IEC 60749-41:2020

Document: references other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente  

Edition 2023-03
Original language German
Price from 112.30 €
Order from DIN Media
Table of contents

Contact

Elena Rongen

Merianstraße 28
63069 Offenbach am Main

Tel.: +49 69 6308-429

Send message to contact