NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61751 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60068-2-1 | 1993-03 | Environmental testing; part 2: tests; tests A: cold (IEC 60068-2-1:1990) More |
| IEC 60068-2-1 | 1990-04 | Environmental testing; part 2: tests; tests A: cold More |
| IEC 60068-2-14 | 1984 | Basic environmental testing procedures. Part 2 : Tests. Test N: Change of temperature More |
| IEC 60747-1 | 1983 | Semiconductor devices. Discrete devices. Part 1 : General More |
| IEC 60747-1 AMD 3 | 1996-09 | Semiconductor devices - Discrete devices and integrated circuits - Part 1: General; Amendment 3 More |
| IEC 60747-12-2 ; QC 720102:1995-07 | 1995-07 | Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems More |
| IEC 60749 | 1996-10 | Semiconductor devices - Mechanical and climatic test methods More |
