2. Getting involved
  3. Standards Committees
  4. DKE
NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

DIN EN 60749-30 [Withdrawn] references following documents:

Document number Edition Title
IEC 60749-25 2003-07 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling More 
IEC 60749-33 2004-03 Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave More 
IEC 60749-4 2002-04 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) More 
IEC 60749-5 2003-01 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test More