NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 60749-34 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| IEC 60747-1 | 1983 | Semiconductor devices. Discrete devices. Part 1 : General More |
| IEC 60747-2 | 2000-03 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes More |
| IEC 60747-6 | 2000-12 | Semiconductor devices - Part 6: Thyristors More |
| IEC 60749-23 | 2004-02 | Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life More |
| IEC 60749-3 | 2002-04 | Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination More |
