NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61747-1 [CURRENT] references following documents:
| Document number | Edition | Title |
|---|---|---|
| EN 60068-1 | 1994-10 | Environmental testing - Part 1: General and guidance (IEC 60068-1:1988 + Corrigendum 1988 + A1:1992) More |
| EN 60749 | 1999-01 | Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996) More |
| EN 61747-2-1 | 2001-06 | Liquid crystal and solid-state display devices - Part 2-1: Passive matrix monochrome LCD modules; Blank detail specification (IEC 61747-2-1:1998) More |
| EN 61747-3-1 | 1999-09 | Liquid crystal and solid-state display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification (IEC 61747-3-1:1998) More |
| EN 61747-4 | 1998-10 | Liquid crystal and solid-state display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics (IEC 61747-4:1998) More |
| EN 61747-5 | 1998-09 | Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998) More |
| IEC 47C/145/CDV ; IEC 60747-5:1996-06 ; IEC-PN 47C/747-5/f1:1996-06 | 1996-06 | Measuring method for carrier to noise ratio of an analogue laser More |
| IEC 60068-1 | 1988 | Environmental testing. Part 1: General and guidance More |
| IEC 60191-1 | 1966 | Mechanical standardization of semiconductor devices. Part 1 : Preparation of drawings of semiconductor devices More |
| IEC 60191-2 | 1966 | Mechanical standardization of semiconductor devices. Part 2 : Dimensions More |
