NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
DIN EN 61643-341 ; VDE 0845-5-4:2002-11 [Withdrawn] references following documents:
| Document number | Edition | Title |
|---|---|---|
| DIN EN 61083-1 ; VDE 0432-7:2002-01 | 2002-01 | Instruments and software used for measurements in high-voltage impulse tests - Part 1: Requirements for instruments (IEC 61083-1:2001); German version EN 61083-1:2001 More |
| DIN IEC 60747-2 | 2001-02 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000) More |
| IEC 37/281/CDV ; IEC 60099-4:2002-05 ; IEC-PN 37/60099-4:2002-05 | 2002-05 | IEC 60099-4, Ed. 2: Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems More |
| IEC 47/1423/CDV ; IEC 60747-1:1998-05 ; IEC-PN 47/60747-1:1998-05 | 1998-05 | Amendments to the IEV, Chapter 521: Semiconductor devices and integrated circuits More |
| IEC 60050-191 | 1990-12 | International electrotechnical vocabulary; chapter 191: dependability and quality of service More |
| IEC 60050-702 | 1992-03 | International electrotechnical vocabulary; chapter 702: oscillations, signals and related devices More |
| IEC 60721-3-3 | 1994-12 | Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities; section 3: Stationary use at weatherprotected locations More |
| IEC 60721-3-9 | 1993-07 | Classification of environmental conditions; part 3: classification of groups of environmental parameters and their severities; section 9: microclimates inside products More |
| IEC 60747-2 | 2000-03 | Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes More |
| IEC 60749 | 1996-10 | Semiconductor devices - Mechanical and climatic test methods More |
