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NA 022

DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

About DKE Projects Drafts Publications Documents withdrawn without replacement National committees European committees International committees

Standards [Withdrawn]

DIN EN 60749
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001

Title (German)

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren (IEC 60749:1996 + A1:2000 + A2:2001); Deutsche Fassung EN 60749:1999 + A1:2000 + A2:2001

Document: references other documents

Document: referenced in other documents

Responsible national committee

DKE/K 631 - Halbleiterbauelemente

Responsible international committee

IEC/TC 47 - Semiconductor devices

Edition 2002-09

Original language German

Price from 163.40 €

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Table of contents

Contact

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